Ключевые слова: HTS, FCL inductive, YBCO, films, substrate sapphire, recovery characteristics, cooling technology, experimental results, power equipment
Ключевые слова: HTS, presentation, cables triaxial, review, transformers, dielectrics, dielectric properties, nanoscaled effects, HTS, YBCO, coated conductors, fabrication, MOCVD process, RABITS process, Jc/B curves, angular dependence, anisotropy, substrate sapphire, fibers, review, power equipment, critical caracteristics
Ключевые слова: HTS, YBCO, substrate sapphire, films, switching process, pulsed operation, numerical analysis, length
Petrisor T., Ciontea L., Galluzzi V., Gambardella U., Mancini A., Rufoloni A., Vannozzi A., Celentano G., Fabbri F., Augieri A., Padeletti G., Cusma A.
Ключевые слова: HTS, YBCO, films, substrate sapphire, meander, FCL resistive, current limiting characteristics, numerical analysis, experimental results, power equipment
Larbalestier D.C., Singh R.K., Gandikota R., Newman N., Rowell J.M., Shen Y., Hunte F.L., Jaroszynski J.
Lee C., Li Q., Xi X.X., Redwing J.M., Wang S.F., Soukiassian A., Schlom D.G., Lamborn D.R., Chen K., DeFrain R.
Ключевые слова: MgB2, films thick, substrate sapphire, defects columnar, grain size, pinning force, microstructure, experimental results
Ключевые слова: HTS, REBCO, films, substrate sapphire, buffer layers, fabrication, magnetron sputtering, thickness dependence, microstructure, Jc/B curves, critical caracteristics
Nakamura T., Sohma M., Yamaguchi I., Tsukada K., Kumagai T., Koyanagi K., Sato R., Tsuchiya T., Ebisawa T., Ohtsu H.
Antognazza L., Decroux M., Fischer O., Grilli F., Duron J.(joseph.duron@epfl.ch), Dutoit B*1.
Ключевые слова: HTS, YBCO, films, substrate sapphire, FCL resistive, numerical analysis, temperature dependence, modeling, power equipment
Yamasaki H., Nakagawa Y., Develos-Bagarinao K.(develos-bagarinao@aist.go.jp), Ohki K.
Ключевые слова: HTS, YBCO, films, substrate sapphire, protection layer Au, FCL resistive, modeling computational, overcurrent, power equipment
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